Scanning Electron / Ion / Probe Microscopy in Materials Characterization
This course “Scanning Electron / Ion / Probe Microscopy in Materials Characterization” will provides in- depth understanding on three different microscopy techniques to students as well as engineers, technicians, and researchers (material and biological scientists). These three scanning microscopy techniques are widely used to obtain the surface morphology of solid materials (primarily) at nanometer range. The topics will cover not only basic principles of these techniques and different parameters that affect the image quality but also preparation of different types of samples and the interpretation of results/data. The advancements to these microscopic techniques will be briefed with examples.
INTENDED AUDIENCE :B.Tech./M.Tech./Ph.D. students and researchers from academics and industries.PREREQUISITES : M.Sc./BEINDUSTRIES SUPPORT :Any industries related to materials